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Relaxing Direct Ptychography Sampling Requirements via Parallax Imaging Insights.

Georgios Varnavides^1,2, Julie Marie Bekkevold³, Stephanie M Ribet²

¹Miller Institute for Basic Research in Science, University of California Berkeley, Stanley Hall Room 206B, Berkeley, CA 94720, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

|April 29, 2026

Summary

This summary is machine-generated.

Direct ptychography, a phase retrieval technique, traditionally faces resolution limits due to probe step size. This study introduces scan-upsampling by approximating parallax imaging within direct ptychography, enhancing resolution without stringent sampling.

Keywords:

STEM phase contrast/retrieval direct ptychography parallax imaging scan Nyquist limit

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Area of Science:

Electron microscopy
Phase contrast imaging
Materials science

Background:

Direct ptychography retrieves phase information from electron waves interacting with samples.
Weak phase object approximation allows noniterative information retrieval.
Traditional direct ptychography resolution is limited by probe step size and Nyquist sampling.

Purpose of the Study:

To overcome resolution limitations in direct ptychography.
To enable scan-upsampling in direct ptychography.
To leverage insights from parallax imaging for improved phase retrieval.

Main Methods:

Formulating parallax imaging as a quadratic approximation of the direct ptychography kernel.
Developing an analytical method to enable upsampling in direct ptychography.
Validating the approach using numerical simulations and experimental data.

Main Results:

Successfully integrated parallax imaging principles into direct ptychography.
Demonstrated the capability of scan-upsampling for enhanced resolution.
Validated the analytical framework through simulations and experimental reconstructions.

Conclusions:

The proposed method enhances direct ptychography by enabling scan-upsampling.
This approach relaxes stringent sampling requirements, improving practical applicability.
The findings offer a pathway to higher resolution phase imaging in electron microscopy.