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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2013
Identifying and correcting scan noise and drift in the scanning transmission electron microscopeLewys Jones, Peter D NellistMicron (Oxford, England : 1993)|January 29, 2014
Testing the accuracy of the two-dimensional object model in HAADF STEMLewys Jones, Peter D NellistMicron (Oxford, England : 1993)|July 16, 2018
Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEMAakash Varambhia, Lewys Jones, Andrew London, et al.Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
How Fast is Your Detector? The Effect of Temporal Response on Image QualityTiarnan Mullarkey, Matthew Geever, Jonathan J P Peters, et al.Nano Letters|October 24, 2014
Rapid estimation of catalyst nanoparticle morphology and atomic-coordination by high-resolution Z-contrast electron microscopyLewys Jones, Katherine E MacArthur, Vidar T Fauske, et al.Physical Review Letters|March 29, 2020
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron MicroscopyAnnelies De Wael, Annick De Backer, Lewys Jones, et al.Ultramicroscopy|December 3, 2014
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolutionTimothy J Pennycook, Andrew R Lupini, Hao Yang, et al.Physical Review Letters|March 2, 2019
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron MicroscopySandra Van Aert, Annick De Backer, Lewys Jones, et al.Ultramicroscopy|April 23, 2017
Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mappingLewys Jones, Sigurd Wenner, Magnus Nord, et al.Pageof 9