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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping.

Lewys Jones¹, Sigurd Wenner², Magnus Nord²

¹Department of Materials, University of Oxford, Oxford, OX13PH, UK.

Ultramicroscopy

|April 23, 2017

Summary

This summary is machine-generated.

Optimizing multi-frame acquisition in scanning transmission electron microscopy significantly reduces scanning artifacts. This approach enhances atomic-resolution strain mapping precision, crucial for materials science defect analysis.

Keywords:

ADF-STEM Aluminium alloys Density functional calculations Experiment design Strain in crystals/solids

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Area of Science:

Materials Science
Condensed Matter Physics
Electron Microscopy

Background:

Annular dark-field scanning transmission electron microscopy (ADF-STEM) enables atomic-scale crystal defect studies.
Low-frequency scanning distortions in single frames limit accurate atomic-resolution strain mapping.

Purpose of the Study:

To determine the optimal number of frames for multi-frame acquisition in ADF-STEM for maximum strain mapping precision.
To investigate dose fractionation strategies for improved strain accuracy under a fixed electron budget.

Main Methods:

Utilized a non-rigid image registration procedure prior to established strain mapping techniques.
Analyzed the impact of varying the number of frames in image series on strain mapping precision.
Investigated dose fractionation for a fixed total electron dose.

Main Results:

Achieved over 70% reduction in scanning artifacts with image series of 20-30 frames.
Strain mapping precision showed little improvement for series longer than 30 frames.
Optimized approach validated by studying strain fields around an aluminum alloy precipitate.

Conclusions:

Multi-frame acquisition with 20-30 frames offers optimal strain mapping precision in ADF-STEM.
The optimized method enhances accuracy for studying strain fields in materials, verified by DFT.
This work provides a guideline for maximizing strain accuracy in ADF-STEM imaging.