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Francesca Adams

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Ultramicroscopy|September 4, 2023
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guideChen Chen, Saptarsi Ghosh, Francesca Adams, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 5, 2024
Sub-surface Imaging of Porous GaN Distributed Bragg Reflectors via Backscattered ElectronsMaruf Sarkar, Francesca Adams, Sidra A Dar, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|September 4, 2023
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guideChen Chen, Saptarsi Ghosh, Francesca Adams, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 5, 2024
Sub-surface Imaging of Porous GaN Distributed Bragg Reflectors via Backscattered ElectronsMaruf Sarkar, Francesca Adams, Sidra A Dar, et al.
Pageof 1