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Franklin R Tanner

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IEEE Transactions on Pattern Analysis and Machine Intelligence|November 17, 2006
A statistics-based approach to binary image registration with uncertainty analysisKatherine M Simonson, Steven M Drescher, Franklin R Tanner
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IEEE Transactions on Pattern Analysis and Machine Intelligence|November 17, 2006
A statistics-based approach to binary image registration with uncertainty analysisKatherine M Simonson, Steven M Drescher, Franklin R Tanner
Pageof 1