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Journal of the American Chemical Society|October 11, 2011
Cathodic corrosion as a facile and effective method to prepare clean metal alloy nanoparticlesParamaconi Rodriguez, Frans D Tichelaar, Marc T M Koper, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|August 2, 2023
Photophysical Characterization of Ru Nanoclusters on Nanostructured TiO2 by Time-Resolved Photoluminescence SpectroscopyKasper Wenderich, Kaijian Zhu, Yibin Bu, et al.
Journal of the American Chemical Society|October 13, 2005
Hydrogen cycling of niobium and vanadium catalyzed nanostructured magnesiumH Gijs Schimmel, Jacques Huot, Laurent C Chapon, et al.
Nanotechnology|March 25, 2015
In situ electrical characterization of tapered InAs nanowires in a transmission electron microscope with ohmic contactsChao Zhang, Mariya Neklyudova, Liang Fang, et al.
Scientific Reports|May 21, 2017
In-situ STEM imaging of growth and phase change of individual CuAlX precipitates in Al alloyChunhui Liu, Sairam K Malladi, Qiang Xu, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 14, 2020
Locally Condensed Water as a Solution for In Situ Wet Corrosion Electron MicroscopyMajid Ahmadi, Frans D Tichelaar, Andreas Ihring, et al.
Nano Letters|September 19, 2014
Solution-phase epitaxial growth of quasi-monocrystalline cuprous oxide on metal nanowiresBeniamino Sciacca, Sander A Mann, Frans D Tichelaar, et al.
Nanoscale Research Letters|August 6, 2016
Optimizing Silicon Oxide Embedded Silicon Nanocrystal Inter-particle DistancesMartijn van Sebille, Jort Allebrandi, Jim Quik, et al.
ACS Applied Materials & Interfaces|February 16, 2018
Cathodic Corrosion of a Bulk Wire to Nonaggregated Functional Nanocrystals and NanoalloysJicheng Feng, Dong Chen, Ahmad S Sediq, et al.
Nano Letters|March 10, 2005
Sculpting nanoelectrodes with a transmission electron beam for electrical and geometrical characterization of nanoparticlesHenny W Zandbergen, Robert J H A van Duuren, Paul F A Alkemade, et al.
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