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Frederick Meisenkothen

Showing results (1-10 of 5) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 13, 2014
The influence of experimental parameters and specimen geometry on the mass spectra of copper during pulsed-laser atom-probe tomographyR Prakash Kolli, Frederick Meisenkothen
Ultramicroscopy|June 12, 2020
Exploring the accuracy of isotopic analyses in atom probe mass spectrometryFrederick Meisenkothen, Daniel V Samarov, Irina Kalish, et al.
Analytical Chemistry|July 23, 2020
Atom Probe Mass Spectrometry of Uranium Isotopic Reference MaterialsFrederick Meisenkothen, Mark McLean, Irina Kalish, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 17, 2009
Electron channeling: a problem for x-ray microanalysis in materials scienceFrederick Meisenkothen, Robert Wheeler, Michael D Uchic, et al.
Ultramicroscopy|September 7, 2015
Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomographyFrederick Meisenkothen, Eric B Steel, Ty J Prosa, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 13, 2014
The influence of experimental parameters and specimen geometry on the mass spectra of copper during pulsed-laser atom-probe tomographyR Prakash Kolli, Frederick Meisenkothen
Ultramicroscopy|June 12, 2020
Exploring the accuracy of isotopic analyses in atom probe mass spectrometryFrederick Meisenkothen, Daniel V Samarov, Irina Kalish, et al.
Analytical Chemistry|July 23, 2020
Atom Probe Mass Spectrometry of Uranium Isotopic Reference MaterialsFrederick Meisenkothen, Mark McLean, Irina Kalish, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 17, 2009
Electron channeling: a problem for x-ray microanalysis in materials scienceFrederick Meisenkothen, Robert Wheeler, Michael D Uchic, et al.
Ultramicroscopy|September 7, 2015
Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomographyFrederick Meisenkothen, Eric B Steel, Ty J Prosa, et al.
Pageof 1