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G Audoit

Showing results (1-10 of 7) with videos related to

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Micron (Oxford, England : 1993)|December 10, 2013
Deep sub micrometer imaging of defects in copper pillars by X-ray tomography in a SEMD Laloum, F Lorut, J Bertheau, et al.
Journal of Microscopy|August 19, 2014
Reduction of the scanning time by total variation minimization reconstruction for X-ray tomography in a SEMD Laloum, T Printemps, D F Sanchez, et al.
Journal of Microscopy|August 12, 2016
3D correlative morphological and elemental characterization of materials at the deep submicrometre scaleA Priebe, G Goret, P Bleuet, et al.
Nanotechnology|February 7, 2013
Chemical and structural properties of conducting nanofilaments in TiN/HfO2-based resistive switching structuresP Calka, E Martinez, V Delaye, et al.
Ultramicroscopy|June 30, 2018
3D high resolution imaging for microelectronics: A multi-technique survey on copper pillarsA Fraczkiewicz, F Lorut, G Audoit, et al.
Ultramicroscopy|November 6, 2013
3D analysis of advanced nano-devices using electron and atom probe tomographyA Grenier, S Duguay, J P Barnes, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 12, 2013
Specifications for hard condensed matter specimens for three-dimensional high-resolution tomographiesP Bleuet, G Audoit, J-P Barnes, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Micron (Oxford, England : 1993)|December 10, 2013
Deep sub micrometer imaging of defects in copper pillars by X-ray tomography in a SEMD Laloum, F Lorut, J Bertheau, et al.
Journal of Microscopy|August 19, 2014
Reduction of the scanning time by total variation minimization reconstruction for X-ray tomography in a SEMD Laloum, T Printemps, D F Sanchez, et al.
Journal of Microscopy|August 12, 2016
3D correlative morphological and elemental characterization of materials at the deep submicrometre scaleA Priebe, G Goret, P Bleuet, et al.
Nanotechnology|February 7, 2013
Chemical and structural properties of conducting nanofilaments in TiN/HfO2-based resistive switching structuresP Calka, E Martinez, V Delaye, et al.
Ultramicroscopy|June 30, 2018
3D high resolution imaging for microelectronics: A multi-technique survey on copper pillarsA Fraczkiewicz, F Lorut, G Audoit, et al.
Ultramicroscopy|November 6, 2013
3D analysis of advanced nano-devices using electron and atom probe tomographyA Grenier, S Duguay, J P Barnes, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 12, 2013
Specifications for hard condensed matter specimens for three-dimensional high-resolution tomographiesP Bleuet, G Audoit, J-P Barnes, et al.
Pageof 1