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Nanotechnology|September 3, 2009
Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopyG Gramse, I Casuso, J Toset, et al.
Nanotechnology|March 18, 2014
Calibrated complex impedance and permittivity measurements with scanning microwave microscopyG Gramse, M Kasper, L Fumagalli, et al.
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