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G J Rottman

Showing results (1-10 of 4) with videos related to

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Applied Optics|October 12, 2010
Photometric calibration of the first three spectroscopic orders of an extreme-ultraviolet spectrometer by use of synchrotron radiationS Osterman, G J Rottman
Applied Optics|August 14, 2010
Position offsets in curved-channel microchannel plate detectorsD M Hassler, G J Rottman, G M Lawrence
Applied Optics|October 12, 2010
Scattered-light properties of diffraction gratingsT N Woods, R T Wrigley Iii, G J Rottman, et al.
Applied Optics|February 1, 1997
Comparison of the imaging characteristics of curved-channel and straight-channel microchannel platesS N Osterman, G J Rottman, D M Hassler, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Applied Optics|October 12, 2010
Photometric calibration of the first three spectroscopic orders of an extreme-ultraviolet spectrometer by use of synchrotron radiationS Osterman, G J Rottman
Applied Optics|August 14, 2010
Position offsets in curved-channel microchannel plate detectorsD M Hassler, G J Rottman, G M Lawrence
Applied Optics|October 12, 2010
Scattered-light properties of diffraction gratingsT N Woods, R T Wrigley Iii, G J Rottman, et al.
Applied Optics|February 1, 1997
Comparison of the imaging characteristics of curved-channel and straight-channel microchannel platesS N Osterman, G J Rottman, D M Hassler, et al.
Pageof 1