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Nanotechnology|July 2, 2024
Simultaneous mapping of cathodoluminescence spectra and backscatter diffraction patterns in a scanning electron microscopePaul R Edwards, G Naresh Kumar, Jonathan J D McKendry, et al.Nano Letters|May 1, 2019
Determining GaN Nanowire Polarity and its Influence on Light Emission in the Scanning Electron MicroscopeG Naresh-Kumar, J Bruckbauer, A Winkelmann, et al.Scientific Reports|September 9, 2017
Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffractionG Naresh-Kumar, A Vilalta-Clemente, H Jussila, et al.Physical Review Letters|May 1, 2012
Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscopeG Naresh-Kumar, B Hourahine, P R Edwards, et al.Scientific Reports|September 9, 2017
Spatially-resolved optical and structural properties of semi-polar [Formula: see text] Al <sub>x</sub> Ga<sub>1-x</sub> N with x up to 0.56Jochen Bruckbauer, Zhi Li, G Naresh-Kumar, et al.Pageof 4