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Scientific Reports|March 3, 2015
Determining chemically and spatially resolved atomic profile of low contrast interface structure with high resolutionMaheswar Nayak, P C Pradhan, G S LodhaApplied Optics|May 14, 2015
Optical properties of zirconium carbide in 60-200 Å wavelength region using x-ray reflectivity techniqueAmol Singh, Mohammed H Modi, G S LodhaApplied Optics|October 2, 2010
Optical properties of indium phosphide in the 50-200 Å wavelength region using a reflectivity techniqueP N Rao, Mohammed H Modi, G S LodhaJournal of Synchrotron Radiation|December 25, 2013
Beamline BL-07 at Indus-2: a facility for microfabrication researchV P Dhamgaye, G S Lodha, B Gowri Sankar, et al.Applied Optics|October 3, 2013
Stability and normal incidence reflectivity of W/B4C multilayer mirror near the boron K absorption edgeP N Rao, S K Rai, M Nayak, et al.Applied Optics|June 15, 2012
Quantitative determination of higher harmonic content in the soft x-ray spectra of toroidal grating monochromator using a reflection multilayerMohammed H Modi, R K Gupta, Amol Singh, et al.Analytical Sciences : the International Journal of the Japan Society for Analytical Chemistry|July 26, 2005
Effect of energy dependence of primary beam divergence on the X-ray standing wave characterization of layered materialsM K Tiwari, S R Naik, G S Lodha, et al.Environmental Monitoring and Assessment|November 7, 2013
Energy-dispersive X-ray fluorescence spectrometry technique as an efficient monitoring tool for mercury contaminationC K Bhat, C L Bhat, G S Lodha, et al.The Review of Scientific Instruments|May 3, 2014
Analysis of higher harmonic contamination with a modified approach using a grating analyserRajkumar Gupta, Mohammed H Modi, M Kumar, et al.Optics Express|July 10, 2012
NbC/Si multilayer mirror for next generation EUV light sourcesMohammed H Modi, S K Rai, Mourad Idir, et al.Pageof 2