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Proceedings of the National Academy of Sciences of the United States of America|July 18, 2018
Electrometry by optical charge conversion of deep defects in 4H-SiCG Wolfowicz, S J Whiteley, D D AwschalomNature Communications|July 31, 2019
Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopyS J Whiteley, F J Heremans, G Wolfowicz, et al.Pageof 1