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Ga Won Lee

Showing results (21-30 of 40) with videos related to

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Micromachines|November 27, 2021
High Pressure Deuterium Passivation of Charge Trapping Layer for Nonvolatile Memory ApplicationsJae-Young Sung, Jun-Kyo Jeong, Woon-San Ko, et al.
Micromachines|November 27, 2021
Physical and Electrical Analysis of Poly-Si Channel Effect on SONOS Flash MemoryJun-Kyo Jeong, Jae-Young Sung, Woon-San Ko, et al.
Journal of Korean Medical Science|November 2, 2019
Neurofeedback Treatment on Depressive Symptoms and Functional Recovery in Treatment-Resistant Patients with Major Depressive Disorder: an Open-Label Pilot StudyYoung Ji Lee, Ga Won Lee, Wan Seok Seo, et al.
RSC Advances|November 25, 2024
Rapid activation of a solution-processed aluminum oxide gate dielectric through intense pulsed light irradiationYeon-Wha Oh, Hoon Kim, Lee-Mi Do, et al.
Sensors (Basel, Switzerland)|November 26, 2022
Bottom-Gated ZnO TFT Pressure Sensor with 1D NanorodsKi-Nam Kim, Woon-San Ko, Jun-Ho Byun, et al.
Frontiers in Veterinary Science|February 3, 2022
Case Report: Long-Term Survival of a Dog With Chronic Lymphocytic Leukemia Treated With Chlorambucil, Prednisolone, and ImatinibGa-Won Lee, Min-Hee Kang, Jin-Ha Jeon, et al.
Journal of Nanoscience and Nanotechnology|April 28, 2019
Gate Voltage Dependence of Low Frequency Noise in Tunneling Field Effect TransistorsSo-Yeong Kim, Hyeong-Sub Song, Sung-Kyu Kwon, et al.
Journal of Nanoscience and Nanotechnology|April 28, 2019
Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate StacksHyeong-Sub Song, So-Yeong Kim, Dong-Hwan Lim, et al.
Journal of Nanoscience and Nanotechnology|November 30, 2011
Study of surface-modified PVP gate dielectric in organic thin film transistors with the nano-particle silver ink source/drain electrodeHo-Jin Yun, Yong-Hyun Ham, Hong-Sik Shin, et al.
Nanotechnology|June 21, 2023
Performance enhancement of HfO<sub>2</sub>-based resistive random-access memory devices using ZnO nanoparticlesJun-Ho Byun, Woon-San Ko, Ki-Nam Kim, et al.
Pageof 4

Showing results (21-30 of 40) with videos related to

Sort By:
Pageof 4
Micromachines|November 27, 2021
High Pressure Deuterium Passivation of Charge Trapping Layer for Nonvolatile Memory ApplicationsJae-Young Sung, Jun-Kyo Jeong, Woon-San Ko, et al.
Micromachines|November 27, 2021
Physical and Electrical Analysis of Poly-Si Channel Effect on SONOS Flash MemoryJun-Kyo Jeong, Jae-Young Sung, Woon-San Ko, et al.
Journal of Korean Medical Science|November 2, 2019
Neurofeedback Treatment on Depressive Symptoms and Functional Recovery in Treatment-Resistant Patients with Major Depressive Disorder: an Open-Label Pilot StudyYoung Ji Lee, Ga Won Lee, Wan Seok Seo, et al.
RSC Advances|November 25, 2024
Rapid activation of a solution-processed aluminum oxide gate dielectric through intense pulsed light irradiationYeon-Wha Oh, Hoon Kim, Lee-Mi Do, et al.
Sensors (Basel, Switzerland)|November 26, 2022
Bottom-Gated ZnO TFT Pressure Sensor with 1D NanorodsKi-Nam Kim, Woon-San Ko, Jun-Ho Byun, et al.
Frontiers in Veterinary Science|February 3, 2022
Case Report: Long-Term Survival of a Dog With Chronic Lymphocytic Leukemia Treated With Chlorambucil, Prednisolone, and ImatinibGa-Won Lee, Min-Hee Kang, Jin-Ha Jeon, et al.
Journal of Nanoscience and Nanotechnology|April 28, 2019
Gate Voltage Dependence of Low Frequency Noise in Tunneling Field Effect TransistorsSo-Yeong Kim, Hyeong-Sub Song, Sung-Kyu Kwon, et al.
Journal of Nanoscience and Nanotechnology|April 28, 2019
Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate StacksHyeong-Sub Song, So-Yeong Kim, Dong-Hwan Lim, et al.
Journal of Nanoscience and Nanotechnology|November 30, 2011
Study of surface-modified PVP gate dielectric in organic thin film transistors with the nano-particle silver ink source/drain electrodeHo-Jin Yun, Yong-Hyun Ham, Hong-Sik Shin, et al.
Nanotechnology|June 21, 2023
Performance enhancement of HfO<sub>2</sub>-based resistive random-access memory devices using ZnO nanoparticlesJun-Ho Byun, Woon-San Ko, Ki-Nam Kim, et al.
Pageof 4