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Drug Development and Industrial Pharmacy
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April 18, 2013
Understanding the thermodynamic micro-environment inside a pan coater using a data logging device
Preetanshu Pandey, Jiangning Ji, Ganeshkumar Subramanian, et al.
Drug Development and Industrial Pharmacy
|
May 4, 2013
Correlating bilayer tablet delamination tendencies to micro-environmental thermodynamic conditions during pan coating
Brian M Zacour, Preetanshu Pandey, Ganeshkumar Subramanian, et al.
International Journal of Pharmaceutics
|
September 18, 2012
Mechanistic basis for the effects of process parameters on quality attributes in high shear wet granulation
Sherif I F Badawy, Ajit S Narang, Keirnan LaMarche, et al.
Journal of Pharmaceutical Sciences
|
February 9, 2016
Process Analytical Technology for High Shear Wet Granulation: Wet Mass Consistency Reported by In-Line Drag Flow Force Sensor Is Consistent With Powder Rheology Measured by At-Line FT4 Powder Rheometer
Ajit S Narang, Valery Sheverev, Tim Freeman, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
Drug Development and Industrial Pharmacy
|
April 18, 2013
Understanding the thermodynamic micro-environment inside a pan coater using a data logging device
Preetanshu Pandey, Jiangning Ji, Ganeshkumar Subramanian, et al.
Drug Development and Industrial Pharmacy
|
May 4, 2013
Correlating bilayer tablet delamination tendencies to micro-environmental thermodynamic conditions during pan coating
Brian M Zacour, Preetanshu Pandey, Ganeshkumar Subramanian, et al.
International Journal of Pharmaceutics
|
September 18, 2012
Mechanistic basis for the effects of process parameters on quality attributes in high shear wet granulation
Sherif I F Badawy, Ajit S Narang, Keirnan LaMarche, et al.
Journal of Pharmaceutical Sciences
|
February 9, 2016
Process Analytical Technology for High Shear Wet Granulation: Wet Mass Consistency Reported by In-Line Drag Flow Force Sensor Is Consistent With Powder Rheology Measured by At-Line FT4 Powder Rheometer
Ajit S Narang, Valery Sheverev, Tim Freeman, et al.
Page
of 1