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Gazzadi

Showing results (1-10 of 24) with videos related to

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Beilstein Journal of Nanotechnology|July 23, 2015
Structural transitions in electron beam deposited Co-carbonyl suspended nanowires at high electrical current densitiesGian Carlo Gazzadi, Stefano Frabboni
Journal of Physics. Condensed Matter : an Institute of Physics Journal|March 3, 2016
AFM-based tribological study of nanopatterned surfaces: the influence of contact area instabilitiesA Rota, E Serpini, G C Gazzadi, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|April 6, 2013
Origin of hydrophobicity in FIB-nanostructured Si surfacesAlberto Rota, Manoj Tripathi, GianCarlo Gazzadi, et al.
Nanotechnology|August 11, 2011
Imparting chemical specificity to nanometer-spaced electrodesAndrea Alessandrini, Lorenzo Berti, Gian Carlo Gazzadi, et al.
Ultramicroscopy|March 25, 2015
Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-upStefano Frabboni, Gian Carlo Gazzadi, Vincenzo Grillo, et al.
Ultramicroscopy|June 2, 2005
Focused ion beam-nanomachined probes for improved electric force microscopyClaudia Menozzi, Gian Carlo Gazzadi, Andrea Alessandrini, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 5, 2013
FIB preparation of a NiO Wedge-Lamella and STEM X-ray microanalysis for the determination of the experimental k(O-Ni) Cliff-Lorimer coefficientAldo Armigliato, Stefano Frabboni, Gian Carlo Gazzadi, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 1, 2018
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin FilmsAndrea Parisini, Stefano Frabboni, Gian Carlo Gazzadi, et al.
Nanotechnology|August 15, 2017
Alloy multilayers and ternary nanostructures by direct-write approachF Porrati, R Sachser, G C Gazzadi, et al.
Physical Review Letters|February 7, 2015
Holographic generation of highly twisted electron beamsVincenzo Grillo, Gian Carlo Gazzadi, Erfan Mafakheri, et al.
Pageof 3

Showing results (1-10 of 24) with videos related to

Sort By:
Pageof 3
Beilstein Journal of Nanotechnology|July 23, 2015
Structural transitions in electron beam deposited Co-carbonyl suspended nanowires at high electrical current densitiesGian Carlo Gazzadi, Stefano Frabboni
Journal of Physics. Condensed Matter : an Institute of Physics Journal|March 3, 2016
AFM-based tribological study of nanopatterned surfaces: the influence of contact area instabilitiesA Rota, E Serpini, G C Gazzadi, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|April 6, 2013
Origin of hydrophobicity in FIB-nanostructured Si surfacesAlberto Rota, Manoj Tripathi, GianCarlo Gazzadi, et al.
Nanotechnology|August 11, 2011
Imparting chemical specificity to nanometer-spaced electrodesAndrea Alessandrini, Lorenzo Berti, Gian Carlo Gazzadi, et al.
Ultramicroscopy|March 25, 2015
Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-upStefano Frabboni, Gian Carlo Gazzadi, Vincenzo Grillo, et al.
Ultramicroscopy|June 2, 2005
Focused ion beam-nanomachined probes for improved electric force microscopyClaudia Menozzi, Gian Carlo Gazzadi, Andrea Alessandrini, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 5, 2013
FIB preparation of a NiO Wedge-Lamella and STEM X-ray microanalysis for the determination of the experimental k(O-Ni) Cliff-Lorimer coefficientAldo Armigliato, Stefano Frabboni, Gian Carlo Gazzadi, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 1, 2018
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin FilmsAndrea Parisini, Stefano Frabboni, Gian Carlo Gazzadi, et al.
Nanotechnology|August 15, 2017
Alloy multilayers and ternary nanostructures by direct-write approachF Porrati, R Sachser, G C Gazzadi, et al.
Physical Review Letters|February 7, 2015
Holographic generation of highly twisted electron beamsVincenzo Grillo, Gian Carlo Gazzadi, Erfan Mafakheri, et al.
Pageof 3