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Georg H Simon

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Angewandte Chemie (International Ed. in English)|October 9, 2020
Potential-Dependent Morphology of Copper Catalysts During CO<sub>2</sub> Electroreduction Revealed by In Situ Atomic Force MicroscopyGeorg H Simon, Christopher S Kley, Beatriz Roldan Cuenya
Beilstein Journal of Nanotechnology|October 7, 2011
Defects in oxide surfaces studied by atomic force and scanning tunneling microscopyThomas König, Georg H Simon, Lars Heinke, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|June 15, 2010
Local work function differences at line defects in aluminium oxide on NiAl(110)Lars Heinke, Leonid Lichtenstein, Georg H Simon, et al.
ACS Nano|May 5, 2010
Direct measurement of the attractive interaction forces on F0 color centers on MgO(001) by dynamic force microscopyThomas König, Georg H Simon, Umberto Martinez, et al.
ACS Applied Materials & Interfaces|November 16, 2020
Atomic-Scale Imprinting by Sputter Deposition of Amorphous Metallic FilmsZheng Chen, Amit Datye, Georg H Simon, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Angewandte Chemie (International Ed. in English)|October 9, 2020
Potential-Dependent Morphology of Copper Catalysts During CO<sub>2</sub> Electroreduction Revealed by In Situ Atomic Force MicroscopyGeorg H Simon, Christopher S Kley, Beatriz Roldan Cuenya
Beilstein Journal of Nanotechnology|October 7, 2011
Defects in oxide surfaces studied by atomic force and scanning tunneling microscopyThomas König, Georg H Simon, Lars Heinke, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|June 15, 2010
Local work function differences at line defects in aluminium oxide on NiAl(110)Lars Heinke, Leonid Lichtenstein, Georg H Simon, et al.
ACS Nano|May 5, 2010
Direct measurement of the attractive interaction forces on F0 color centers on MgO(001) by dynamic force microscopyThomas König, Georg H Simon, Umberto Martinez, et al.
ACS Applied Materials & Interfaces|November 16, 2020
Atomic-Scale Imprinting by Sputter Deposition of Amorphous Metallic FilmsZheng Chen, Amit Datye, Georg H Simon, et al.
Pageof 1