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Gert Nolze

Showing results (1-10 of 21) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 7, 2013
Azimuthal projections: data rotation and projection switching in real timeGert Nolze
Ultramicroscopy|October 4, 2006
Image distortions in SEM and their influences on EBSD measurementsGert Nolze
Ultramicroscopy|December 2, 2014
Chirality determination of quartz crystals using electron backscatter diffractionAimo Winkelmann, Gert Nolze
Ultramicroscopy|December 17, 2009
Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of siliconAimo Winkelmann, Gert Nolze
Journal of Applied Crystallography|April 10, 2023
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 3. PseudosymmetryGert Nolze, Tomasz Tokarski, Łukasz Rychłowski
Journal of Applied Crystallography|April 10, 2023
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 1. Where is the Bragg angle?Gert Nolze, Tomasz Tokarski, Łukasz Rychłowski
Journal of Applied Crystallography|April 10, 2023
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset correctionsGert Nolze, Tomasz Tokarski, Łukasz Rychłowski
Journal of Microscopy|November 1, 2007
SEM investigation of interfacial dislocations in nickel-base superalloysAlexander Epishin, Thomas Link, Gert Nolze
Ultramicroscopy|October 31, 2015
Pattern matching approach to pseudosymmetry problems in electron backscatter diffractionGert Nolze, Aimo Winkelmann, Alan P Boyle
Journal of Applied Crystallography|April 14, 2020
Manual measurement of angles in backscattered and transmission Kikuchi diffraction patternsGert Nolze, Tomasz Tokarski, Grzegorz Cios, et al.
Pageof 3

Showing results (1-10 of 21) with videos related to

Sort By:
Pageof 3
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 7, 2013
Azimuthal projections: data rotation and projection switching in real timeGert Nolze
Ultramicroscopy|October 4, 2006
Image distortions in SEM and their influences on EBSD measurementsGert Nolze
Ultramicroscopy|December 2, 2014
Chirality determination of quartz crystals using electron backscatter diffractionAimo Winkelmann, Gert Nolze
Ultramicroscopy|December 17, 2009
Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of siliconAimo Winkelmann, Gert Nolze
Journal of Applied Crystallography|April 10, 2023
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 3. PseudosymmetryGert Nolze, Tomasz Tokarski, Łukasz Rychłowski
Journal of Applied Crystallography|April 10, 2023
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 1. Where is the Bragg angle?Gert Nolze, Tomasz Tokarski, Łukasz Rychłowski
Journal of Applied Crystallography|April 10, 2023
Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset correctionsGert Nolze, Tomasz Tokarski, Łukasz Rychłowski
Journal of Microscopy|November 1, 2007
SEM investigation of interfacial dislocations in nickel-base superalloysAlexander Epishin, Thomas Link, Gert Nolze
Ultramicroscopy|October 31, 2015
Pattern matching approach to pseudosymmetry problems in electron backscatter diffractionGert Nolze, Aimo Winkelmann, Alan P Boyle
Journal of Applied Crystallography|April 14, 2020
Manual measurement of angles in backscattered and transmission Kikuchi diffraction patternsGert Nolze, Tomasz Tokarski, Grzegorz Cios, et al.
Pageof 3