X-ray Crystallography
X-ray Diffraction of Biological Samples
The de Broglie Wavelength
Determination of Crystal Structures
The Pauli Exclusion Principle
Scanning Electron Microscopy
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Mar 31, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Gert Nolze1, Aimo Winkelmann2, Alan P Boyle3
1Dept 5.1, Federal Institute for Materials, Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany.
This study presents a new algorithm to solve Kikuchi pattern misindexing issues in electron backscatter diffraction (EBSD) by comparing experimental data with simulations. The method accurately determines crystal orientation, improving precision in materials analysis.
08:44Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
Published on: August 22, 2017
08:53Biochemical and Structural Characterization of the Carbohydrate Transport Substrate-binding-protein SP0092
Published on: October 2, 2017
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: