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Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction.

Gert Nolze1, Aimo Winkelmann2, Alan P Boyle3

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Summary
This summary is machine-generated.

This study presents a new algorithm to solve Kikuchi pattern misindexing issues in electron backscatter diffraction (EBSD) by comparing experimental data with simulations. The method accurately determines crystal orientation, improving precision in materials analysis.

Keywords:
Cross-correlationEBSDHough transformationOrientation precisionPattern simulationPseudosymmetryPyrite

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Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Electron Backscatter Diffraction (EBSD) is a key technique for crystal orientation mapping.
  • Crystallographic pseudosymmetry can lead to significant misindexing errors in EBSD data.
  • Accurate crystallographic orientation is crucial for understanding material properties.

Purpose of the Study:

  • To develop and validate an algorithm for correcting Kikuchi pattern misindexing caused by pseudosymmetry in EBSD.
  • To enhance the accuracy and reliability of crystallographic orientation determination using EBSD.
  • To demonstrate the practical application of the developed method on a relevant material.

Main Methods:

  • Quantitative comparison of experimentally acquired Kikuchi patterns with dynamical electron diffraction simulations.
  • Development of an algorithm to identify the optimal crystallographic orientation from a set of pseudosymmetric candidates.
  • Application and testing of the algorithm using EBSD measurements on framboidal pyrite (FeS2).

Main Results:

  • Successfully overcome Kikuchi pattern misindexing problems arising from crystallographic pseudosymmetry.
  • The algorithm accurately identifies the correct crystal orientation among pseudosymmetric possibilities.
  • Demonstrated improved orientation precision in EBSD measurements on framboidal pyrite.

Conclusions:

  • The developed algorithm effectively resolves EBSD misindexing issues due to pseudosymmetry.
  • This approach significantly enhances the precision of crystallographic orientation determination.
  • The method offers a robust solution for accurate EBSD analysis in materials with pseudosymmetric structures.