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Giessibl

Showing results (1-10 of 69) with videos related to

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Physical Review. B, Condensed Matter|June 15, 1992
Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopyGiessibl
Science (New York, N.Y.)|January 6, 1995
Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopyF J Giessibl
Molecules (Basel, Switzerland)|July 19, 2021
Probing the Nature of Chemical Bonds by Atomic Force MicroscopyFranz J Giessibl
Science (New York, N.Y.)|June 22, 2013
Chemistry. Seeing the reactionFranz J Giessibl
The Review of Scientific Instruments|February 3, 2019
The qPlus sensor, a powerful core for the atomic force microscopeFranz J Giessibl
Science (New York, N.Y.)|July 21, 2000
Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force MicroscopyGiessibl, Hembacher, Bielefeldt, et al.
Science (New York, N.Y.)|August 24, 2019
Calvin F. Quate (1923-2019)Daniel Rugar, Franz Giessibl
The Review of Scientific Instruments|October 7, 2011
Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudesElisabeth Wutscher, Franz J Giessibl
The Review of Scientific Instruments|March 3, 2011
Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopyT Wutscher, F J Giessibl
The Review of Scientific Instruments|August 3, 2017
Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperaturesFerdinand Huber, Franz J Giessibl
Pageof 7

Showing results (1-10 of 69) with videos related to

Sort By:
Pageof 7
Physical Review. B, Condensed Matter|June 15, 1992
Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopyGiessibl
Science (New York, N.Y.)|January 6, 1995
Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopyF J Giessibl
Molecules (Basel, Switzerland)|July 19, 2021
Probing the Nature of Chemical Bonds by Atomic Force MicroscopyFranz J Giessibl
Science (New York, N.Y.)|June 22, 2013
Chemistry. Seeing the reactionFranz J Giessibl
The Review of Scientific Instruments|February 3, 2019
The qPlus sensor, a powerful core for the atomic force microscopeFranz J Giessibl
Science (New York, N.Y.)|July 21, 2000
Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force MicroscopyGiessibl, Hembacher, Bielefeldt, et al.
Science (New York, N.Y.)|August 24, 2019
Calvin F. Quate (1923-2019)Daniel Rugar, Franz Giessibl
The Review of Scientific Instruments|October 7, 2011
Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudesElisabeth Wutscher, Franz J Giessibl
The Review of Scientific Instruments|March 3, 2011
Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopyT Wutscher, F J Giessibl
The Review of Scientific Instruments|August 3, 2017
Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperaturesFerdinand Huber, Franz J Giessibl
Pageof 7