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Spectrochimica Acta. Part A, Molecular and Biomolecular Spectroscopy|October 23, 2001
Mapping the chemistry in nanostructured materials by energy-filtering transmission electron microscopy (EFTEM)F Hofer, P Warbichler, H Kronberger, et al.Micron (Oxford, England : 1993)|April 16, 2003
Width determination of SiO2-films in Si-based devices using low-loss EFTEM: image contrast as a function of sample thicknessBernhard Schaffer, Werner Grogger, Ferdinand HoferUltramicroscopy|February 5, 2022
A method for a column-by-column EELS quantification of barium lanthanum ferrateJudith Lammer, Christian Berger, Stefan Löffler, et al.Micron (Oxford, England : 1993)|March 24, 2006
Electron-irradiation damage in chromium nitrides and chromium oxynitride thin filmsChristoph Mitterbauer, Werner Grogger, Peter Wilhartitz, et al.Ultramicroscopy|October 30, 2016
Quantitative EDXS: Influence of geometry on a four detector systemJohanna Kraxner, Margit Schäfer, Otto Röschel, et al.Ultramicroscopy|July 23, 2003
Energy-filtering TEM at high magnification: spatial resolution and detection limitsWerner Grogger, Bernhard Schaffer, Kannan M Krishnan, et al.Journal of Microscopy|December 12, 2001
Electron energy loss near edge structure on the nitrogen K-edge in vanadium nitridesF Hofer, P Warbichler, A Scott, et al.Nanotechnology|April 11, 2013
Chemical tuning of PtC nanostructures fabricated via focused electron beam induced depositionHarald Plank, Thomas Haber, Christian Gspan, et al.Spectrochimica Acta. Part A, Molecular and Biomolecular Spectroscopy|October 23, 2001
Formation of niobium nitride by rapid thermal processingC Angelkort, H Lewalter, P Warbichler, et al.Nanotechnology|August 13, 2011
The influence of beam defocus on volume growth rates for electron beam induced platinum depositionH Plank, C Gspan, M Dienstleder, et al.Pageof 599