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Journal of Synchrotron Radiation|December 23, 2017
Coatings for FEL optics: preparation and characterization of B4C and PtMichael Störmer, Frank Siewert, Christian Horstmann, et al.Nanomaterials (Basel, Switzerland)|July 2, 2021
Shape- and Element-Sensitive Reconstruction of Periodic Nanostructures with Grazing Incidence X-ray Fluorescence Analysis and Machine LearningAnna Andrle, Philipp Hönicke, Grzegorz Gwalt, et al.Journal of Synchrotron Radiation|December 23, 2017
Diffraction gratings metrology and ray-tracing results for an XUV Raman spectrometer at FLASHSiarhei Dziarzhytski, Frank Siewert, Andrey Sokolov, et al.Journal of Synchrotron Radiation|December 23, 2017
Damage thresholds for blaze diffraction gratings and grazing incidence optics at an X-ray free-electron laserJacek Krzywinski, Raymond Conley, Stefan Moeller, et al.The Review of Scientific Instruments|December 5, 2025
Invited Article: High-quality blazed gratings through synergy between e-beam lithography and robust characterization techniquesAnalía F Herrero, Nazanin Samadi, Andrey Sokolov, et al.Optics Express|June 30, 2019
Optimized highly efficient multilayer-coated blazed gratings for the tender X-ray regionAndrey Sokolov, Qiushi Huang, Friedmar Senf, et al.The Review of Scientific Instruments|August 27, 2025
Improving the quality of x-ray mirrors: An inter-lab, optical metrology collaboration to guide deterministic polishingSimon G Alcock, Ioana-Theodora Nistea, Murilo Bazan da Silva, et al.Small (Weinheim an Der Bergstrasse, Germany)|November 25, 2021
Simultaneous Dimensional and Analytical Characterization of Ordered NanostructuresPhilipp Hönicke, Yves Kayser, Konstantin V Nikolaev, et al.Journal of Synchrotron Radiation|May 5, 2022
The meV XUV-RIXS facility at UE112-PGM1 of BESSY IIKarl Bauer, Jan Simon Schmidt, Frank Eggenstein, et al.Journal of Synchrotron Radiation|September 3, 2021
Performance and characterization of the FinEstBeAMS beamline at the MAX IV LaboratoryKirill Chernenko, Antti Kivimäki, Rainer Pärna, et al.Pageof 2