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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 8, 2013
Electron energy loss spectroscopy characterization of TANOS (TaN/Al₂O₃/Si₃N₄/SiO₂/Si) stacksJucheol Park, Sung Heo, JaeGwan Chung, et al.
Scientific Reports|April 6, 2016
High mobility and high stability glassy metal-oxynitride materials and devicesEunha Lee, Taeho Kim, Anass Benayad, et al.
Physical Review Letters|August 29, 2014
Hidden structural order in orthorhombic Ta2O5Sung-Hoon Lee, Jongseob Kim, Sae-Jin Kim, et al.
Dalton Transactions (Cambridge, England : 2003)|March 9, 2019
First-row early transition metal complexes with a highly sterically demanding triisopropylphenyl amino triphenolate ligand: synthesis and applicationsDae Young Bae, Gyeong Su Park, Nakeun Ko, et al.
Chemical Communications (Cambridge, England)|August 23, 2003
Solid-solid transformation mechanism for nanocrystalline sodalite from pillared clayJin-Ho Choy, Sung-Reol Lee, Yang-Su Han, et al.
Ultramicroscopy|June 12, 2009
Bandgap measurement of thin dielectric films using monochromated STEM-EELSJucheol Park, Sung Heo, Jae-Gwan Chung, et al.
Organic Letters|December 5, 2019
Organophotocatalytic Arene Functionalization: C-C and C-B Bond FormationDa Seul Lee, Chung Soo Kim, Naila Iqbal, et al.
ACS Applied Materials & Interfaces|December 21, 2024
Silicon Etching Using Copper-Metal-Assisted Chemical Etching: Unveiling the Role of Cu<sub>2</sub>O in Microscale Structure FabricationEunsol Lee, Sangseung Park, Gyeong-Su Park, et al.
Advanced Materials (Deerfield Beach, Fla.)|October 11, 2021
Vertically Stacked Full Color Quantum Dots Phototransistor Arrays for High-Resolution and Enhanced Color-Selective ImagingJaehyun Kim, Chanho Jo, Myung-Gil Kim, et al.
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