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H C Mertins

Showing results (1-10 of 5) with videos related to

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Journal of Synchrotron Radiation|September 5, 2018
Soft X-ray refractive index by reconciling total electron yield with specular reflection: experimental determination of the optical constants of graphiteC Jansing, H Wahab, H Timmers, et al.
Applied Optics|February 15, 2008
W/C, W/Ti, Ni/Ti, and Ni/V Multilayers for the Soft-X-ray Range: Experimental Investigation with Synchrotron RadiationH C Mertins, F Schäfers, H Grimmer, et al.
Physical Review Letters|July 20, 2001
Observation of the x-ray magneto-optical Voigt effectH C Mertins, P M Oppeneer, J Kunes, et al.
Applied Optics|February 13, 2008
Cr /sc multilayers for the soft-x-ray rangeF Schäfers, H C Mertins, F Schmolla, et al.
Applied Optics|March 8, 2008
Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of lightF Schäfers, H C Mertins, A Gaupp, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Journal of Synchrotron Radiation|September 5, 2018
Soft X-ray refractive index by reconciling total electron yield with specular reflection: experimental determination of the optical constants of graphiteC Jansing, H Wahab, H Timmers, et al.
Applied Optics|February 15, 2008
W/C, W/Ti, Ni/Ti, and Ni/V Multilayers for the Soft-X-ray Range: Experimental Investigation with Synchrotron RadiationH C Mertins, F Schäfers, H Grimmer, et al.
Physical Review Letters|July 20, 2001
Observation of the x-ray magneto-optical Voigt effectH C Mertins, P M Oppeneer, J Kunes, et al.
Applied Optics|February 13, 2008
Cr /sc multilayers for the soft-x-ray rangeF Schäfers, H C Mertins, F Schmolla, et al.
Applied Optics|March 8, 2008
Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of lightF Schäfers, H C Mertins, A Gaupp, et al.
Pageof 1