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H Giovannini

Showing results (1-10 of 17) with videos related to

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Applied Optics|February 13, 2008
Dielectric thin films for maximized absorption with standard quality black surfacesH Giovannini, C Amra
Optics Letters|October 29, 2009
Interferometric configuration based on a grating interferometer for the measurement of the phase between TE and TM polarizations after diffraction by gratingsH Giovannini, H Akhouayri
Applied Optics|August 1, 1997
Scattering-reduction effect with overcoated rough surfaces: theory and experimentH Giovannini, C Amra
Applied Optics|December 4, 2010
Ellipsometry of light scattering from multilayer coatingsC Deumié, H Giovannini, C Amra
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|April 6, 2002
Scattering from rough inhomogeneous media: splitting of surface and volume scatteringA Sentenac, H Giovannini, M Saillard
Optics Letters|December 19, 2007
Increasing the angular tolerance of resonant grating filters with doubly periodic structuresF Lemarchand, A Sentenac, H Giovannini
Applied Optics|March 28, 2008
Interferometric measurement of the phase of diffracted waves near the plasmon resonances of metallic gratingsN Destouches, H Giovannini, M Lequime
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|December 4, 2012
Full polarization optical profilometryS Arhab, H Giovannini, K Belkebir, et al.
Optics Letters|December 12, 2007
Extraction of light from sources located inside waveguide grating structuresH Rigneault, F Lemarchand, A Sentenac, et al.
Optics Letters|November 3, 2009
Angle-resolved polarimetric phase measurement for the characterization of gratingsH Giovannini, C Deumié, H Akhouayri, et al.
Pageof 2

Showing results (1-10 of 17) with videos related to

Sort By:
Pageof 2
Applied Optics|February 13, 2008
Dielectric thin films for maximized absorption with standard quality black surfacesH Giovannini, C Amra
Optics Letters|October 29, 2009
Interferometric configuration based on a grating interferometer for the measurement of the phase between TE and TM polarizations after diffraction by gratingsH Giovannini, H Akhouayri
Applied Optics|August 1, 1997
Scattering-reduction effect with overcoated rough surfaces: theory and experimentH Giovannini, C Amra
Applied Optics|December 4, 2010
Ellipsometry of light scattering from multilayer coatingsC Deumié, H Giovannini, C Amra
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|April 6, 2002
Scattering from rough inhomogeneous media: splitting of surface and volume scatteringA Sentenac, H Giovannini, M Saillard
Optics Letters|December 19, 2007
Increasing the angular tolerance of resonant grating filters with doubly periodic structuresF Lemarchand, A Sentenac, H Giovannini
Applied Optics|March 28, 2008
Interferometric measurement of the phase of diffracted waves near the plasmon resonances of metallic gratingsN Destouches, H Giovannini, M Lequime
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|December 4, 2012
Full polarization optical profilometryS Arhab, H Giovannini, K Belkebir, et al.
Optics Letters|December 12, 2007
Extraction of light from sources located inside waveguide grating structuresH Rigneault, F Lemarchand, A Sentenac, et al.
Optics Letters|November 3, 2009
Angle-resolved polarimetric phase measurement for the characterization of gratingsH Giovannini, C Deumié, H Akhouayri, et al.
Pageof 2