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H J Frankena

Showing results (1-10 of 17) with videos related to

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Applied Optics|June 18, 2010
Integrated optical interferometer with a stacked waveguide structureS Wu, H J Frankena
Applied Optics|February 21, 2008
Testing aspheric surfaces: simple method with a circular stopA Handojo, H J Frankena
Applied Optics|March 4, 2010
Fast computation method for derivatives of multilayer stack reflectanceC J Laan, H J Frankena
Applied Optics|April 15, 1986
Nonparaxial theory of curved hologramsK O Peng, H J Frankena
Applied Optics|October 12, 2010
Real-time displacement measurement using a multicamera phase-stepping speckle interferometerA J Haasteren, H J Frankena
Applied Optics|April 17, 2010
Production of high-quality V-coatingsC J Laan, H J Frankena
Applied Optics|October 22, 2010
Equivalent layers: another way to look at themC J van der Laan, H J Frankena
Applied Optics|February 28, 2008
Fluid jet polishing of optical surfacesO W Fähnle, H Brug, H J Frankena
Applied Optics|June 12, 2010
Thickness measurement using Young's interferometric experimentC J van der Laan, H J Frankena
Applied Optics|August 12, 2010
Linear approximation for measurement errors in phase shifting interferometryJ van Wingerden, H J Frankena, C Smorenburg
Pageof 2

Showing results (1-10 of 17) with videos related to

Sort By:
Pageof 2
Applied Optics|June 18, 2010
Integrated optical interferometer with a stacked waveguide structureS Wu, H J Frankena
Applied Optics|February 21, 2008
Testing aspheric surfaces: simple method with a circular stopA Handojo, H J Frankena
Applied Optics|March 4, 2010
Fast computation method for derivatives of multilayer stack reflectanceC J Laan, H J Frankena
Applied Optics|April 15, 1986
Nonparaxial theory of curved hologramsK O Peng, H J Frankena
Applied Optics|October 12, 2010
Real-time displacement measurement using a multicamera phase-stepping speckle interferometerA J Haasteren, H J Frankena
Applied Optics|April 17, 2010
Production of high-quality V-coatingsC J Laan, H J Frankena
Applied Optics|October 22, 2010
Equivalent layers: another way to look at themC J van der Laan, H J Frankena
Applied Optics|February 28, 2008
Fluid jet polishing of optical surfacesO W Fähnle, H Brug, H J Frankena
Applied Optics|June 12, 2010
Thickness measurement using Young's interferometric experimentC J van der Laan, H J Frankena
Applied Optics|August 12, 2010
Linear approximation for measurement errors in phase shifting interferometryJ van Wingerden, H J Frankena, C Smorenburg
Pageof 2