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H J Tiziani

Showing results (1-10 of 46) with videos related to

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Applied Optics|February 2, 2010
Analysis of mechanical oscillations by specklingH J Tiziani
Applied Optics|November 10, 2010
Semispatial, robust, and accurate phase evaluation algorithmR Windecker, H J Tiziani
Applied Optics|August 15, 1985
Testing aspheric surfaces with computer-generated holograms: analysis of adjustment and shape errorsB Dorband, H J Tiziani
Applied Optics|November 6, 2010
Topometry of technical and biological objects by fringe projectionR Windecker, H J Tiziani
Applied Optics|March 24, 2010
Vibration analysis by speckle techniques in real timeH J Tiziani, J Klenk
Applied Optics|October 22, 2010
Double-pulse electronic speckle interferometry for vibration analysisG Pedrini, H J Tiziani
Optics Letters|December 12, 2007
Phase-shifting polarization interferometry for microstructure linewidth measurementM Totzeck, H J Tiziani
Applied Optics|September 24, 2010
Three-dimensional analysis by a microlens-array confocal arrangementH J Tiziani, H M Uhde
Applied Optics|October 2, 2010
Three-dimensional image sensing by chromatic confocal microscopyH J Tiziani, H M Uhde
Applied Optics|October 14, 2010
Oblique incidence and observation electronic speckle-pattern interferometryC Joenathan, B Franze, H J Tiziani
Pageof 5

Showing results (1-10 of 46) with videos related to

Sort By:
Pageof 5
Applied Optics|February 2, 2010
Analysis of mechanical oscillations by specklingH J Tiziani
Applied Optics|November 10, 2010
Semispatial, robust, and accurate phase evaluation algorithmR Windecker, H J Tiziani
Applied Optics|August 15, 1985
Testing aspheric surfaces with computer-generated holograms: analysis of adjustment and shape errorsB Dorband, H J Tiziani
Applied Optics|November 6, 2010
Topometry of technical and biological objects by fringe projectionR Windecker, H J Tiziani
Applied Optics|March 24, 2010
Vibration analysis by speckle techniques in real timeH J Tiziani, J Klenk
Applied Optics|October 22, 2010
Double-pulse electronic speckle interferometry for vibration analysisG Pedrini, H J Tiziani
Optics Letters|December 12, 2007
Phase-shifting polarization interferometry for microstructure linewidth measurementM Totzeck, H J Tiziani
Applied Optics|September 24, 2010
Three-dimensional analysis by a microlens-array confocal arrangementH J Tiziani, H M Uhde
Applied Optics|October 2, 2010
Three-dimensional image sensing by chromatic confocal microscopyH J Tiziani, H M Uhde
Applied Optics|October 14, 2010
Oblique incidence and observation electronic speckle-pattern interferometryC Joenathan, B Franze, H J Tiziani
Pageof 5