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Science (New York, N.Y.)
|
February 20, 1970
Image-formation technique for scanning electron microscopy and electron probe microanalysis
K F Heinrich, C Fiori, H Yakowitz
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
December 12, 2019
Role of Nickel in Al-10 Percent Si Composites Containing Nickel-Coated Sapphire Whiskers
H Yakowitz, W D Jenkins, H Hahn
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
December 14, 2019
Metallographic Characterization of an NBS Spectrometric Low-Alloy Steel Standard
R E Michaelis, H Yakowitz, G A Moore
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of 1
Search research articles
Search
Showing results (1-10 of 3) with videos related to
Sort By:
Page
of 1
Science (New York, N.Y.)
|
February 20, 1970
Image-formation technique for scanning electron microscopy and electron probe microanalysis
K F Heinrich, C Fiori, H Yakowitz
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
December 12, 2019
Role of Nickel in Al-10 Percent Si Composites Containing Nickel-Coated Sapphire Whiskers
H Yakowitz, W D Jenkins, H Hahn
Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|
December 14, 2019
Metallographic Characterization of an NBS Spectrometric Low-Alloy Steel Standard
R E Michaelis, H Yakowitz, G A Moore
Page
of 1