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Hailong Jing

Showing results (1-10 of 6) with videos related to

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Optics Express|February 7, 2018
Optical 3-D surface reconstruction with color binary speckle pattern encodingPei Zhou, Jiangping Zhu, Hailong Jing
Optics Express|September 17, 2008
3D shape measurement of the aspheric mirror by advanced phase measuring deflectometryYan Tang, Xianyu Su, Yuankun Liu, et al.
Accident; Analysis and Prevention|June 23, 2020
Automated traffic incident detection with a smaller dataset based on generative adversarial networksYi Lin, Linchao Li, Hailong Jing, et al.
Optics Express|January 22, 2015
Modulation measuring profilometry with auto-synchronous phase shifting and vertical scanningMin Zhong, Xianyu Su, Wenjing Chen, et al.
Applied Optics|April 18, 2017
Experimental study of temporal-spatial binary pattern projection for 3D shape acquisitionPei Zhou, Jiangping Zhu, Xianyu Su, et al.
Optics Express|August 13, 2025
Multidimensional computed measurement for highly accurate PCBA defect detectionZefang Chen, Qican Zhang, Mingyuan Zhong, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Optics Express|February 7, 2018
Optical 3-D surface reconstruction with color binary speckle pattern encodingPei Zhou, Jiangping Zhu, Hailong Jing
Optics Express|September 17, 2008
3D shape measurement of the aspheric mirror by advanced phase measuring deflectometryYan Tang, Xianyu Su, Yuankun Liu, et al.
Accident; Analysis and Prevention|June 23, 2020
Automated traffic incident detection with a smaller dataset based on generative adversarial networksYi Lin, Linchao Li, Hailong Jing, et al.
Optics Express|January 22, 2015
Modulation measuring profilometry with auto-synchronous phase shifting and vertical scanningMin Zhong, Xianyu Su, Wenjing Chen, et al.
Applied Optics|April 18, 2017
Experimental study of temporal-spatial binary pattern projection for 3D shape acquisitionPei Zhou, Jiangping Zhu, Xianyu Su, et al.
Optics Express|August 13, 2025
Multidimensional computed measurement for highly accurate PCBA defect detectionZefang Chen, Qican Zhang, Mingyuan Zhong, et al.
Pageof 1