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Optics Express
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February 7, 2018
Optical 3-D surface reconstruction with color binary speckle pattern encoding
Pei Zhou, Jiangping Zhu, Hailong Jing
Optics Express
|
September 17, 2008
3D shape measurement of the aspheric mirror by advanced phase measuring deflectometry
Yan Tang, Xianyu Su, Yuankun Liu, et al.
Accident; Analysis and Prevention
|
June 23, 2020
Automated traffic incident detection with a smaller dataset based on generative adversarial networks
Yi Lin, Linchao Li, Hailong Jing, et al.
Optics Express
|
January 22, 2015
Modulation measuring profilometry with auto-synchronous phase shifting and vertical scanning
Min Zhong, Xianyu Su, Wenjing Chen, et al.
Applied Optics
|
April 18, 2017
Experimental study of temporal-spatial binary pattern projection for 3D shape acquisition
Pei Zhou, Jiangping Zhu, Xianyu Su, et al.
Optics Express
|
August 13, 2025
Multidimensional computed measurement for highly accurate PCBA defect detection
Zefang Chen, Qican Zhang, Mingyuan Zhong, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 6) with videos related to
Sort By:
Page
of 1
Optics Express
|
February 7, 2018
Optical 3-D surface reconstruction with color binary speckle pattern encoding
Pei Zhou, Jiangping Zhu, Hailong Jing
Optics Express
|
September 17, 2008
3D shape measurement of the aspheric mirror by advanced phase measuring deflectometry
Yan Tang, Xianyu Su, Yuankun Liu, et al.
Accident; Analysis and Prevention
|
June 23, 2020
Automated traffic incident detection with a smaller dataset based on generative adversarial networks
Yi Lin, Linchao Li, Hailong Jing, et al.
Optics Express
|
January 22, 2015
Modulation measuring profilometry with auto-synchronous phase shifting and vertical scanning
Min Zhong, Xianyu Su, Wenjing Chen, et al.
Applied Optics
|
April 18, 2017
Experimental study of temporal-spatial binary pattern projection for 3D shape acquisition
Pei Zhou, Jiangping Zhu, Xianyu Su, et al.
Optics Express
|
August 13, 2025
Multidimensional computed measurement for highly accurate PCBA defect detection
Zefang Chen, Qican Zhang, Mingyuan Zhong, et al.
Page
of 1