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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Advancing the hexapole Cs-corrector for the scanning transmission electron microscopeHeiko Müller, Stephan Uhlemann, Peter Hartel, et al.Journal of Electron Microscopy|April 29, 2009
First application of Cc-corrected imaging for high-resolution and energy-filtered TEMBernd Kabius, Peter Hartel, Maximilian Haider, et al.Physical Review Letters|August 13, 2013
Thermal magnetic field noise limits resolution in transmission electron microscopyStephan Uhlemann, Heiko Müller, Peter Hartel, et al.Ultramicroscopy|July 17, 2023
A novel ground-potential monochromator designFelix Börrnert, Stephan Uhlemann, Heiko Müller, et al.Ultramicroscopy|December 16, 2014
Thermal magnetic field noise: electron optics and decoherenceStephan Uhlemann, Heiko Müller, Joachim Zach, et al.Ultramicroscopy|December 17, 2021
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kVRyusuke Sagawa, Akira Yasuhara, Hiroki Hashiguchi, et al.Physical Review Letters|August 27, 2016
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kVMartin Linck, Peter Hartel, Stephan Uhlemann, et al.Physical Review Letters|April 27, 2011
Probing the out-of-plane distortion of single point defects in atomically thin hexagonal boron nitride at the picometer scaleNasim Alem, Oleg V Yazyev, Christian Kisielowski, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Atomic scale analysis of planar defects in polycrystalline diamondRolf Erni, Bert Freitag, Peter Hartel, et al.Journal of Electron Microscopy|June 24, 2005
Experimental evaluation of a spherical aberration-corrected TEM and STEMHidetaka Sawada, Takeshi Tomita, Mikio Naruse, et al.Pageof 13