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Hendrix Demers

Showing results (11-20 of 32) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 5, 2019
The f-Ratio Quantification Method for X-ray Microanalysis Applied to Mg-Al-Zn AlloysChaoyi Teng, Hendrix Demers, Xin Chu, et al.
Scanning|February 27, 2013
Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterizationNicolas Brodusch, Hendrix Demers, Michel Trudeau, et al.
Microscopy Research and Technique|January 7, 2014
Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth oreNicolas Brodusch, Kristian Waters, Hendrix Demers, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 9, 2012
The probe profile and lateral resolution of scanning transmission electron microscopy of thick specimensHendrix Demers, Ranjan Ramachandra, Dominique Drouin, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 5, 2018
Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral CharacterizationChaoyi Teng, Hendrix Demers, Nicolas Brodusch, et al.
Ultramicroscopy|January 1, 2019
Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission modeNicolas Brodusch, Hendrix Demers, Alexandra Gellé, et al.
Ultramicroscopy|September 28, 2020
Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materialsYu Yuan, Hendrix Demers, Nicolas Brodusch, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Win X-ray: a new Monte Carlo program that computes X-ray spectra obtained with a scanning electron microscopeRaynald Gauvin, Eric Lifshin, Hendrix Demers, et al.
Chemistryopen|March 1, 2019
Facile Protection of Lithium Metal for All-Solid-State BatteriesNicolas Delaporte, Abdelbast Guerfi, Hendrix Demers, et al.
Ultramicroscopy|June 15, 2010
Nanometer-resolution electron microscopy through micrometers-thick water layersNiels de Jonge, Nicolas Poirier-Demers, Hendrix Demers, et al.
Pageof 4

Showing results (11-20 of 32) with videos related to

Sort By:
Pageof 4
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 5, 2019
The f-Ratio Quantification Method for X-ray Microanalysis Applied to Mg-Al-Zn AlloysChaoyi Teng, Hendrix Demers, Xin Chu, et al.
Scanning|February 27, 2013
Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterizationNicolas Brodusch, Hendrix Demers, Michel Trudeau, et al.
Microscopy Research and Technique|January 7, 2014
Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth oreNicolas Brodusch, Kristian Waters, Hendrix Demers, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 9, 2012
The probe profile and lateral resolution of scanning transmission electron microscopy of thick specimensHendrix Demers, Ranjan Ramachandra, Dominique Drouin, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 5, 2018
Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral CharacterizationChaoyi Teng, Hendrix Demers, Nicolas Brodusch, et al.
Ultramicroscopy|January 1, 2019
Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission modeNicolas Brodusch, Hendrix Demers, Alexandra Gellé, et al.
Ultramicroscopy|September 28, 2020
Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materialsYu Yuan, Hendrix Demers, Nicolas Brodusch, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Win X-ray: a new Monte Carlo program that computes X-ray spectra obtained with a scanning electron microscopeRaynald Gauvin, Eric Lifshin, Hendrix Demers, et al.
Chemistryopen|March 1, 2019
Facile Protection of Lithium Metal for All-Solid-State BatteriesNicolas Delaporte, Abdelbast Guerfi, Hendrix Demers, et al.
Ultramicroscopy|June 15, 2010
Nanometer-resolution electron microscopy through micrometers-thick water layersNiels de Jonge, Nicolas Poirier-Demers, Hendrix Demers, et al.
Pageof 4