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Hongxin Luo

Showing results (1-10 of 12) with videos related to

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Applied Optics|December 29, 2004
Comparison of superresolution effects with annular phase and amplitude filtersHongxin Luo, Changhe Zhou
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|January 7, 2006
Talbot effect of a grating with different kinds of flawsYunqing Lu, Changhe Zhou, Hongxin Luo
Applied Optics|August 4, 2005
Highly sensitive wave-front sensor with a non-zero-order phase plateHongxin Luo, Changhe Zhou, Hua Zou
Applied Optics|September 14, 2023
Synchrotron radiation stability with meV-level energy resolution: in situ characterizationShangYu Si, ZhongLiang Li, Lian Xue, et al.
Applied Optics|June 13, 2014
Absolute surface metrology by rotational averaging in oblique incidence interferometryWeihao Lin, Yumei He, Li Song, et al.
The Review of Scientific Instruments|February 1, 2023
Characterization of the error of the speckle-based wavefront metrology device at Shanghai Synchrotron Radiation FacilityLian Xue, Zhongliang Li, Shangyu Si, et al.
Sensors (Basel, Switzerland)|November 25, 2020
Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning TechniqueLian Xue, Hongxin Luo, Qianshun Diao, et al.
The Review of Scientific Instruments|August 12, 2025
Optical measurement and manufacture at the Shanghai Synchrotron Radiation FacilityNa Yang, Haipeng Zhang, Zhongliang Li, et al.
Journal of Synchrotron Radiation|September 7, 2019
High-efficiency fast X-ray imaging detector development at SSRFHonglan Xie, Hongxin Luo, Guohao Du, et al.
Applied Optics|December 25, 2019
Absolute metrology method of the x-ray mirror with speckle scanning techniqueLian Xue, Zhongliang Li, Tunhe Zhou, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
Applied Optics|December 29, 2004
Comparison of superresolution effects with annular phase and amplitude filtersHongxin Luo, Changhe Zhou
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|January 7, 2006
Talbot effect of a grating with different kinds of flawsYunqing Lu, Changhe Zhou, Hongxin Luo
Applied Optics|August 4, 2005
Highly sensitive wave-front sensor with a non-zero-order phase plateHongxin Luo, Changhe Zhou, Hua Zou
Applied Optics|September 14, 2023
Synchrotron radiation stability with meV-level energy resolution: in situ characterizationShangYu Si, ZhongLiang Li, Lian Xue, et al.
Applied Optics|June 13, 2014
Absolute surface metrology by rotational averaging in oblique incidence interferometryWeihao Lin, Yumei He, Li Song, et al.
The Review of Scientific Instruments|February 1, 2023
Characterization of the error of the speckle-based wavefront metrology device at Shanghai Synchrotron Radiation FacilityLian Xue, Zhongliang Li, Shangyu Si, et al.
Sensors (Basel, Switzerland)|November 25, 2020
Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning TechniqueLian Xue, Hongxin Luo, Qianshun Diao, et al.
The Review of Scientific Instruments|August 12, 2025
Optical measurement and manufacture at the Shanghai Synchrotron Radiation FacilityNa Yang, Haipeng Zhang, Zhongliang Li, et al.
Journal of Synchrotron Radiation|September 7, 2019
High-efficiency fast X-ray imaging detector development at SSRFHonglan Xie, Hongxin Luo, Guohao Du, et al.
Applied Optics|December 25, 2019
Absolute metrology method of the x-ray mirror with speckle scanning techniqueLian Xue, Zhongliang Li, Tunhe Zhou, et al.
Pageof 2