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Journal of Applied Crystallography
|
June 20, 2015
XTOP: high-resolution X-ray diffraction and imaging
Vincent Favre-Nicolin, José Baruchel, Hubert Renevier, et al.
Physical Review Letters
|
November 5, 2004
Magnetite, a model system for mixed-valence oxides, does not show charge ordering
Gloria Subías, Joaquín García, Javier Blasco, et al.
Nanoscale Research Letters
|
March 19, 2013
Ultradense and planarized antireflective vertical silicon nanowire array using a bottom-up technique
Ludovic Dupré, Thérèse Gorisse, Angélique Letrouit Lebranchu, et al.
Nanoscale
|
December 22, 2021
<i>In situ</i> analysis of the nucleation of O- and Zn-polar ZnO nanowires using synchrotron-based X-ray diffraction
Valentina Cantelli, Sophie Guillemin, Eirini Sarigiannidou, et al.
Nanoscale
|
January 3, 2024
Quantitative <i>in situ</i> synchrotron X-ray analysis of the ALD/MLD growth of transition metal dichalcogenide TiS<sub>2</sub> ultrathin films
Ashok-Kumar Yadav, Weiliang Ma, Petros Abi Younes, et al.
Nanoscale
|
June 13, 2018
The initial stages of ZnO atomic layer deposition on atomically flat In<sub>0.53</sub>Ga<sub>0.47</sub>As substrates
Evgeniy V Skopin, Laetitia Rapenne, Hervé Roussel, et al.
Nanotechnology
|
January 31, 2017
Quantitative and simultaneous analysis of the polarity of polycrystalline ZnO seed layers and related nanowires grown by wet chemical deposition
Sophie Guillemin, Romain Parize, Joseph Carabetta, et al.
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Search research articles
Search
Showing results (1-10 of 7) with videos related to
Sort By:
Page
of 1
Journal of Applied Crystallography
|
June 20, 2015
XTOP: high-resolution X-ray diffraction and imaging
Vincent Favre-Nicolin, José Baruchel, Hubert Renevier, et al.
Physical Review Letters
|
November 5, 2004
Magnetite, a model system for mixed-valence oxides, does not show charge ordering
Gloria Subías, Joaquín García, Javier Blasco, et al.
Nanoscale Research Letters
|
March 19, 2013
Ultradense and planarized antireflective vertical silicon nanowire array using a bottom-up technique
Ludovic Dupré, Thérèse Gorisse, Angélique Letrouit Lebranchu, et al.
Nanoscale
|
December 22, 2021
<i>In situ</i> analysis of the nucleation of O- and Zn-polar ZnO nanowires using synchrotron-based X-ray diffraction
Valentina Cantelli, Sophie Guillemin, Eirini Sarigiannidou, et al.
Nanoscale
|
January 3, 2024
Quantitative <i>in situ</i> synchrotron X-ray analysis of the ALD/MLD growth of transition metal dichalcogenide TiS<sub>2</sub> ultrathin films
Ashok-Kumar Yadav, Weiliang Ma, Petros Abi Younes, et al.
Nanoscale
|
June 13, 2018
The initial stages of ZnO atomic layer deposition on atomically flat In<sub>0.53</sub>Ga<sub>0.47</sub>As substrates
Evgeniy V Skopin, Laetitia Rapenne, Hervé Roussel, et al.
Nanotechnology
|
January 31, 2017
Quantitative and simultaneous analysis of the polarity of polycrystalline ZnO seed layers and related nanowires grown by wet chemical deposition
Sophie Guillemin, Romain Parize, Joseph Carabetta, et al.
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of 1