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Ultramicroscopy|June 7, 2000
Measurement of roughness and diffuseness of interfacesHytch, Walls, ChevalierMicroscopy (Oxford, England)|March 25, 2017
STEM moiré analysis for 2D strain measurementsAkimitsu Ishizuka, Martin Hytch, Kazuo IshizukaUltramicroscopy|October 16, 2024
Principle of TEM alignment using convolutional neural networks: Case study on condenser aperture alignmentLoïc Grossetête, Cécile Marcelot, Christophe Gatel, et al.Science (New York, N.Y.)|April 12, 2003
Near-perfect elastoplasticity in pure nanocrystalline copperYannick Champion, Cyril Langlois, Sandrine Guérin-Mailly, et al.Nano Letters|November 23, 2019
One-Pot Seed-Mediated Growth of Co Nanoparticles by the Polyol Process: Unraveling the Heterogeneous NucleationRaj Kumar Ramamoorthy, Arnaud Viola, Bilel Grindi, et al.Nano Letters|September 12, 2007
Synthesis and micrometer-scale assembly of colloidal CdSe/CdS nanorods prepared by a seeded growth approachLuigi Carbone, Concetta Nobile, Milena De Giorgi, et al.Pageof 1