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I A Makhotkin

Showing results (1-10 of 5) with videos related to

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Journal of the Optical Society of America. A, Optics, Image Science, and Vision|April 2, 2021
Refined extreme ultraviolet mask stack modelI A Makhotkin, M Wu, V Soltwisch, et al.
Acta Crystallographica. Section A, Foundations and Advances|September 6, 2018
Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular rangeK V Nikolaev, I A Makhotkin, S N Yakunin, et al.
Optics Express|October 17, 2014
Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structuresS N Yakunin, I A Makhotkin, K V Nikolaev, et al.
Journal of Synchrotron Radiation|March 11, 2020
A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescenceK V Nikolaev, V Soltwisch, P Hönicke, et al.
Acta Crystallographica. Section A, Foundations and Advances|March 2, 2019
Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayersK V Nikolaev, S N Yakunin, I A Makhotkin, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|April 2, 2021
Refined extreme ultraviolet mask stack modelI A Makhotkin, M Wu, V Soltwisch, et al.
Acta Crystallographica. Section A, Foundations and Advances|September 6, 2018
Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular rangeK V Nikolaev, I A Makhotkin, S N Yakunin, et al.
Optics Express|October 17, 2014
Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structuresS N Yakunin, I A Makhotkin, K V Nikolaev, et al.
Journal of Synchrotron Radiation|March 11, 2020
A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescenceK V Nikolaev, V Soltwisch, P Hönicke, et al.
Acta Crystallographica. Section A, Foundations and Advances|March 2, 2019
Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayersK V Nikolaev, S N Yakunin, I A Makhotkin, et al.
Pageof 1