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Applied Optics|June 18, 2010
Investigation of the evaporation process conditions on the optical constants of zirconia filmsJ A Dobrowolski, P D Grant, R Simpson, et al.Applied Optics|March 17, 2006
Toward perfect antireflection coatings. 3. Experimental results obtained with the use of Reststrahlen materialsJ A Dobrowolski, Yanen Guo, Tom Tiwald, et al.Applied Optics|June 18, 2002
Toward perfect antireflection coatings: numerical investigationJ A Dobrowolski, Daniel Poitras, Penghui Ma, et al.Applied Optics|April 5, 2011
Implementation of long-wavelength cut-off filters based on critical angleYanen Guo, J A Dobrowolski, Li Li, et al.Applied Optics|June 18, 2002
Long-wavelength polarizing cutoff filters for the 275-550-nm spectral regionPenghui Ma, J A Dobrowolski, Frances Lin, et al.Applied Optics|June 18, 2010
Synthesis of high rejection filters with the Fourier transform methodP G Verly, J A Dobrowolski, W J Wild, et al.Applied Optics|October 2, 2010
Extreme-ultraviolet Mo/Si multilayer mirrors deposited by radio-frequency-magnetron sputteringC Montcalm, B T Sullivan, H Pépin, et al.Applied Optics|June 5, 2010
Transparent, conducting indium tin oxide films formed on low or medium temperature substrates by ion-assisted depositionJ A Dobrowolski, F C Ho, D Menagh, et al.Applied Optics|June 18, 2002
Black layer coatings for the photolithographic manufacture of diffraction gratingsDaniel Poitras, J A Dobrowolski, Tom Cassidy, et al.Applied Optics|February 12, 2008
Influence of small inhomogeneities on the spectral characteristics of single thin filmsA V Tikhonravov, M K Trubetskov, B T Sullivan, et al.Pageof 56