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Applied Optics|February 16, 2010
OTF measurements with a white light source: an interferometric techniqueJ C WyantApplied Optics|February 16, 2010
Use of an ac heterodyne lateral shear interferometer with real-time wavefront correction systemsJ C WyantApplied Optics|March 25, 2010
Use of a symbolic math system to solve polarized light problemsJ C WyantApplied Optics|September 11, 2010
Absolute testing of flats by using even and odd functionsC Ai, J C WyantPageof 3