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J Frejlich

Showing results (1-10 of 25) with videos related to

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Applied Optics|June 15, 1984
Elsasser-related approximation to the Airy function: commentsM Gibson, J Frejlich
Applied Optics|June 10, 2010
Self-diffraction for intrinsic optical modulation evolution measurement in photoresistsL Cescato, J Frejlich
Applied Optics|April 29, 2010
Implementation of the Abeles method for thin-film refractive-index measurement with transparent substratesM Gibson, J Frejlich
Applied Optics|March 9, 2010
Spectral sensitivity improvement of a commercial negative photoresist: Kodak microresist 747J Frejlich, R Knoesel
Applied Optics|March 10, 2010
Roughness evaluation for thin filmsL Cescato, J Frejlich
Optics Letters|October 27, 2009
Photorefractive response time measurement in GaAs crystals by phase modulation in two-wave mixingS Bian, J Frejlich
Optics Letters|October 28, 2009
Adjustable phase control in stabilized interferometryA A Freschi, J Frejlich
Applied Optics|June 16, 2010
Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometerE A de Oliveira, J Frejlich
Applied Optics|April 15, 1985
Response curve for photosensitive films: a derivative methodL Cescato, G F Mendes, J Frejlich
Optics Letters|September 18, 2009
Adaptive fringe-locked running hologram in photorefractive crystalsJ Frejlich, P M Garcia, L Cescato
Pageof 3

Showing results (1-10 of 25) with videos related to

Sort By:
Pageof 3
Applied Optics|June 15, 1984
Elsasser-related approximation to the Airy function: commentsM Gibson, J Frejlich
Applied Optics|June 10, 2010
Self-diffraction for intrinsic optical modulation evolution measurement in photoresistsL Cescato, J Frejlich
Applied Optics|April 29, 2010
Implementation of the Abeles method for thin-film refractive-index measurement with transparent substratesM Gibson, J Frejlich
Applied Optics|March 9, 2010
Spectral sensitivity improvement of a commercial negative photoresist: Kodak microresist 747J Frejlich, R Knoesel
Applied Optics|March 10, 2010
Roughness evaluation for thin filmsL Cescato, J Frejlich
Optics Letters|October 27, 2009
Photorefractive response time measurement in GaAs crystals by phase modulation in two-wave mixingS Bian, J Frejlich
Optics Letters|October 28, 2009
Adjustable phase control in stabilized interferometryA A Freschi, J Frejlich
Applied Optics|June 16, 2010
Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometerE A de Oliveira, J Frejlich
Applied Optics|April 15, 1985
Response curve for photosensitive films: a derivative methodL Cescato, G F Mendes, J Frejlich
Optics Letters|September 18, 2009
Adaptive fringe-locked running hologram in photorefractive crystalsJ Frejlich, P M Garcia, L Cescato
Pageof 3