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J Grzanna

Showing results (1-10 of 7) with videos related to

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Applied Optics|October 14, 2010
Absolute testing of optical flats at points on a square grid: error propagationJ Grzanna
Applied Optics|August 21, 2010
Absolute flatness testing by the rotation method with optimal measuring-error compensationG Schulz, J Grzanna
Applied Optics|October 2, 2010
Establishing a flatness standardK E Elssner, A Vogel, J Grzanna, et al.
Applied Optics|June 18, 2010
Absolute sphericity measurementK E Elssner, R Burow, J Grzanna, et al.
Applied Optics|September 15, 1985
Homogeneity testing by phase sampling interferometryJ Schwider, R Burow, K E Elssner, et al.
Applied Optics|April 1, 1986
Semiconductor wafer and technical flat planeness testing interferometerJ Schwider, R Burow, K E Elssner, et al.
Applied Optics|November 1, 1983
Digital wave-front measuring interferometry: some systematic error sourcesJ Schwider, R Burow, K E Elssner, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Applied Optics|October 14, 2010
Absolute testing of optical flats at points on a square grid: error propagationJ Grzanna
Applied Optics|August 21, 2010
Absolute flatness testing by the rotation method with optimal measuring-error compensationG Schulz, J Grzanna
Applied Optics|October 2, 2010
Establishing a flatness standardK E Elssner, A Vogel, J Grzanna, et al.
Applied Optics|June 18, 2010
Absolute sphericity measurementK E Elssner, R Burow, J Grzanna, et al.
Applied Optics|September 15, 1985
Homogeneity testing by phase sampling interferometryJ Schwider, R Burow, K E Elssner, et al.
Applied Optics|April 1, 1986
Semiconductor wafer and technical flat planeness testing interferometerJ Schwider, R Burow, K E Elssner, et al.
Applied Optics|November 1, 1983
Digital wave-front measuring interferometry: some systematic error sourcesJ Schwider, R Burow, K E Elssner, et al.
Pageof 1