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J K Erwin

Showing results (1-10 of 14) with videos related to

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Applied Optics|March 18, 2008
Measurement of the relative optical phase between amorphous and crystalline regions of the phase-change media of optical recordingR Liang, J K Erwin, M Mansuripur
Applied Optics|June 22, 2010
Measuring the wavelength dependence of magnetooptical Kerr (or Faraday) rotation and ellipticity: a techniqueM Mansuripur, F Zhou, J K Erwin
Applied Optics|March 18, 2008
Variation on Zernike's phase-contrast microscopeR Liang, J K Erwin, M Mansuripur
Applied Optics|October 2, 2010
Measurement of birefringence for optical recording of disk substratesH Fu, S Sugaya, J K Erwin, et al.
Applied Optics|July 1, 1997
Leaky polarizing beam splitter with adjustable leak ratio for operation in the wavelength range of 440-690 nmL Cheng, C L Bartlett, J K Erwin, et al.
Applied Optics|October 22, 2010
Ring-lens focusing and push-pull tracking scheme for optical disk systemsJ J Zambuto, R E Gerber, J K Erwin, et al.
Applied Optics|October 22, 2010
Retroreflecting ellipsometer for measuring the birefringence of optical disk substratesH Fu, T Goodman, S Sugaya, et al.
Applied Optics|August 25, 2010
Dielectric tensor characterization for magneto-optical recording mediaA F Zhou, J K Erwin, C F Brucker, et al.
Optics Letters|December 7, 2007
High-performance readout and recording by a combination apertureS G Tang, T D Milster, J K Erwin, et al.
Applied Optics|March 28, 2008
Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurementsC Peng, R Liang, J K Erwin, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Applied Optics|March 18, 2008
Measurement of the relative optical phase between amorphous and crystalline regions of the phase-change media of optical recordingR Liang, J K Erwin, M Mansuripur
Applied Optics|June 22, 2010
Measuring the wavelength dependence of magnetooptical Kerr (or Faraday) rotation and ellipticity: a techniqueM Mansuripur, F Zhou, J K Erwin
Applied Optics|March 18, 2008
Variation on Zernike's phase-contrast microscopeR Liang, J K Erwin, M Mansuripur
Applied Optics|October 2, 2010
Measurement of birefringence for optical recording of disk substratesH Fu, S Sugaya, J K Erwin, et al.
Applied Optics|July 1, 1997
Leaky polarizing beam splitter with adjustable leak ratio for operation in the wavelength range of 440-690 nmL Cheng, C L Bartlett, J K Erwin, et al.
Applied Optics|October 22, 2010
Ring-lens focusing and push-pull tracking scheme for optical disk systemsJ J Zambuto, R E Gerber, J K Erwin, et al.
Applied Optics|October 22, 2010
Retroreflecting ellipsometer for measuring the birefringence of optical disk substratesH Fu, T Goodman, S Sugaya, et al.
Applied Optics|August 25, 2010
Dielectric tensor characterization for magneto-optical recording mediaA F Zhou, J K Erwin, C F Brucker, et al.
Optics Letters|December 7, 2007
High-performance readout and recording by a combination apertureS G Tang, T D Milster, J K Erwin, et al.
Applied Optics|March 28, 2008
Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurementsC Peng, R Liang, J K Erwin, et al.
Pageof 2