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J Kreith

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Microelectronic Engineering|June 18, 2015
Measuring electro-mechanical properties of thin films on polymer substratesMegan J Cordill, O Glushko, J Kreith, et al.
The Review of Scientific Instruments|June 3, 2017
A versatile atomic force microscope integrated with a scanning electron microscopeJ Kreith, T Strunz, E J Fantner, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Microelectronic Engineering|June 18, 2015
Measuring electro-mechanical properties of thin films on polymer substratesMegan J Cordill, O Glushko, J Kreith, et al.
The Review of Scientific Instruments|June 3, 2017
A versatile atomic force microscope integrated with a scanning electron microscopeJ Kreith, T Strunz, E J Fantner, et al.
Pageof 1