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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Overview of Microscopy Techniques01:22

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

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Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which...
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Updated: Mar 1, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
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A versatile atomic force microscope integrated with a scanning electron microscope.

J Kreith1, T Strunz2, E J Fantner2

  • 1Department of Material Physics, Montanuniversität Leoben, Jahnstrasse 12, 8700 Leoben, Austria.

The Review of Scientific Instruments
|June 3, 2017
PubMed
Summary
This summary is machine-generated.

A new atomic force microscope (AFM) integrated into a scanning electron microscope (SEM) allows for detailed analysis of material deformation. This combined approach enables precise measurement of slip steps and plastic deformation, advancing dislocation analysis.

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are powerful tools for surface analysis.
  • Correlated imaging and in situ experiments are crucial for understanding material deformation mechanisms.
  • Oxide formation can hinder accurate surface analysis in traditional methods.

Purpose of the Study:

  • To introduce a versatile AFM system designed for integration within a SEM.
  • To demonstrate the capabilities of this combined AFM-SEM system for correlated analysis.
  • To showcase quantitative dislocation analysis through slip step measurements and in situ nanoindentation.

Main Methods:

  • Installation of a specialized AFM within a SEM.
  • Correlated AFM and SEM imaging of nanoindents in single crystalline brass.
  • In situ nanoindentation experiments with simultaneous AFM imaging.
  • Measurement of slip step heights to analyze dislocation emission.

Main Results:

  • Successful correlated imaging of slip steps around nanoindents in brass without oxide hindrance.
  • Demonstration of in situ AFM imaging during nanoindentation to observe plastic deformation.
  • Correlation of mechanical indentation data with AFM/SEM images to estimate dislocation numbers.

Conclusions:

  • The integrated AFM-SEM system offers a flexible platform for advanced material characterization.
  • This technique enables quantitative analysis of dislocation behavior and plastic deformation.
  • The combined approach overcomes limitations of individual techniques, particularly regarding oxide formation.