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Ultramicroscopy|August 2, 2005
Theoretical discussions on the geometrical phase analysisJ L Rouvière, E SarigiannidouUltramicroscopy|February 22, 2011
Dark field electron holography for strain measurementA Béché, J L Rouvière, J P Barnes, et al.Ultramicroscopy|May 16, 2013
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holographyA Béché, J L Rouvière, J P Barnes, et al.Ultramicroscopy|June 6, 2006
Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layersF Houdellier, C Roucau, L Clément, et al.Journal of Microscopy|January 11, 2016
Interfacial chemistry in a ZnTe/CdSe superlattice studied by atom probe tomography and transmission electron microscopy strain measurementsB Bonef, B Haas, J-L Rouvière, et al.Nanotechnology|August 13, 2009
The evolution of the fraction of Er ions sensitized by Si nanostructures in silicon-rich silicon oxide thin filmsP Noé, H Okuno, J-B Jager, et al.Nanotechnology|September 26, 2024
Selective area epitaxy of in-plane HgTe nanostructures on CdTe(001) substrateN Chaize, X Baudry, P-H Jouneau, et al.Pageof 1