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Analytical Chemistry|December 5, 2009
Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ionsJ L S Lee, S Ninomiya, J Matsuo, et al.
Analytical Chemistry|April 18, 2013
Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosingR Havelund, A Licciardello, J Bailey, et al.
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