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J M Saiz

Showing results (1-10 of 27) with videos related to

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Optics Letters|May 27, 2006
Plasmon spectroscopy of metallic nanoparticles above flat dielectric substratesF Moreno, F González, J M Saiz
Applied Optics|October 3, 2013
Comprehensive polarimetric analysis of Spectralon white reflectance standard in a wide visible rangeJ M Sanz, C Extremiana, J M Saiz
Optics Express|August 20, 2008
Surface inspection by monitoring spectral shifts of localized plasmon resonancesP Albella, F Moreno, J M Saiz, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 18, 2005
Two-particle model to study fluctuations of scattered radiation: multiple-scattering effectsO Merchiers, J M Saiz, F González, et al.
Optics Express|June 24, 2009
Backscattering of metallic microstructures with small defects located on flat substratesP Albella, F Moreno, J M Saiz, et al.
Optics Letters|May 12, 2006
Monitoring small defects on surface microstructures through backscattering measurementsP Albella, F Moreno, J M Saiz, et al.
Optics Letters|December 11, 2007
Profile of a fiber from backscattering measurementsJ L de la Peña, J M Saiz, F González
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|November 4, 2008
Exception for the zero-forward-scattering theoryB García-Cámara, F González, F Moreno, et al.
Applied Optics|July 21, 2011
Polar decomposition of the Mueller matrix: a polarimetric rule of thumb for square-profile surface structure recognitionJ M Sanz, J M Saiz, F González, et al.
Optics Express|August 20, 2008
Interaction of nanoparticles with substrates: effects on the dipolar behaviour of the particlesF Moreno, B García-Cámara, J M Saiz, et al.
Pageof 3

Showing results (1-10 of 27) with videos related to

Sort By:
Pageof 3
Optics Letters|May 27, 2006
Plasmon spectroscopy of metallic nanoparticles above flat dielectric substratesF Moreno, F González, J M Saiz
Applied Optics|October 3, 2013
Comprehensive polarimetric analysis of Spectralon white reflectance standard in a wide visible rangeJ M Sanz, C Extremiana, J M Saiz
Optics Express|August 20, 2008
Surface inspection by monitoring spectral shifts of localized plasmon resonancesP Albella, F Moreno, J M Saiz, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 18, 2005
Two-particle model to study fluctuations of scattered radiation: multiple-scattering effectsO Merchiers, J M Saiz, F González, et al.
Optics Express|June 24, 2009
Backscattering of metallic microstructures with small defects located on flat substratesP Albella, F Moreno, J M Saiz, et al.
Optics Letters|May 12, 2006
Monitoring small defects on surface microstructures through backscattering measurementsP Albella, F Moreno, J M Saiz, et al.
Optics Letters|December 11, 2007
Profile of a fiber from backscattering measurementsJ L de la Peña, J M Saiz, F González
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|November 4, 2008
Exception for the zero-forward-scattering theoryB García-Cámara, F González, F Moreno, et al.
Applied Optics|July 21, 2011
Polar decomposition of the Mueller matrix: a polarimetric rule of thumb for square-profile surface structure recognitionJ M Sanz, J M Saiz, F González, et al.
Optics Express|August 20, 2008
Interaction of nanoparticles with substrates: effects on the dipolar behaviour of the particlesF Moreno, B García-Cámara, J M Saiz, et al.
Pageof 3