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J P Cline

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Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Fundamental Parameters Line Profile Fitting in Laboratory DiffractometersR W Cheary, A A Coelho, J P Cline
Radiation Physics and Chemistry (Oxford, England : 1993)|June 4, 2020
Contemporary x-ray wavelength metrology and traceabilityL T Hudson, J P Cline, A Henins, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Fundamental Parameters Line Profile Fitting in Laboratory DiffractometersR W Cheary, A A Coelho, J P Cline
Radiation Physics and Chemistry (Oxford, England : 1993)|June 4, 2020
Contemporary x-ray wavelength metrology and traceabilityL T Hudson, J P Cline, A Henins, et al.
Pageof 1