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Journal of Microscopy|November 15, 2006
Compensation of the shadowing error in three-dimensional imaging with a multiple detector scanning electron microscopeJ Paluszyński, W SlówkoJournal of Microscopy|February 7, 2009
Measurements of the surface microroughness with the scanning electron microscopeJ Paluszyński, W SlówkoJournal of Microscopy|November 15, 2006
New system for secondary electron detection in variable-pressure scanning electron microscopyW SlówkoMicron (Oxford, England : 1993)|February 2, 2023
Ion microsource integrated with scanning electron microscope for sample preparationW Slówko, T GotszalkJournal of Microscopy|May 27, 2010
Electron detection in the intermediate chamber of the variable pressure SEMW Slówko, M KrysztofPageof 1