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Applied Optics|February 16, 2010

Absolute refractive index measurement method over a broad wavelength region based on white-light interferometrySeung Hwan Kim, Seoung Hun Lee, Jae In Lim, et al.

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Applied Optics|February 16, 2010

Absolute refractive index measurement method over a broad wavelength region based on white-light interferometrySeung Hwan Kim, Seoung Hun Lee, Jae In Lim, et al.

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