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Optics Letters|September 14, 2019
Efficient arsenic trisulfide vertical grating coupler on lithium niobate for integrated photonic applicationsMsi Khan, James A Bain, Gianluca Piazza
Nanoscale|September 15, 2017
Scaling behavior of oxide-based electrothermal threshold switching devicesDasheng Li, Jonathan M Goodwill, James A Bain, et al.
ACS Applied Materials & Interfaces|March 16, 2017
Electro-Thermal Model of Threshold Switching in TaOx-Based DevicesJonathan M Goodwill, Abhishek A Sharma, Dasheng Li, et al.
Nanotechnology|February 5, 2013
Pattern transfer with stabilized nanoparticle etch masksCharles R Hogg, Yoosuf N Picard, Amrit Narasimhan, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 23, 2014
In situ TEM imaging of defect dynamics under electrical bias in resistive switching rutile-TiO₂Ranga J Kamaladasa, Abhishek A Sharma, Yu-Ting Lai, et al.
ACS Applied Materials & Interfaces|May 4, 2016
Joule Heating-Induced Metal-Insulator Transition in Epitaxial VO2/TiO2 DevicesDasheng Li, Abhishek A Sharma, Darshil K Gala, et al.
Nanotechnology|August 25, 2017
ON-state evolution in lateral and vertical VO2 threshold switching devicesDasheng Li, Abhishek A Sharma, Nikhil Shukla, et al.
Nature Communications|April 11, 2019
Spontaneous current constriction in threshold switching devicesJonathan M Goodwill, Georg Ramer, Dasheng Li, et al.
ACS Applied Materials & Interfaces|June 29, 2016
Transient Thermometry and High-Resolution Transmission Electron Microscopy Analysis of Filamentary Resistive SwitchesJonghan Kwon, Abhishek A Sharma, Chao-Yang Chen, et al.
ACS Applied Materials & Interfaces|June 19, 2018
Formation of the Conducting Filament in TaO x-Resistive Switching Devices by Thermal-Gradient-Induced Cation AccumulationYuanzhi Ma, Dasheng Li, Andrew A Herzing, et al.
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