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James M Howe

Showing results (1-10 of 18) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 14, 2019
Determining the Volume Expansion at Grain Boundaries Using Extended Energy-Loss Fine Structure AnalysisProloy Nandi, James M Howe
Ultramicroscopy|September 28, 2011
Are electron tweezers possible?Vladimir P Oleshko, James M Howe
Journal of Electron Microscopy|December 8, 2004
Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscaleJames M Howe, Vladimir P Oleshko
Ultramicroscopy|February 14, 2022
Observation of grain boundary plasmon and associated deconvolution techniques for low-loss electron energy-loss (EEL) spectra acquired from grain boundariesProloy Nandi, Eric R Hoglund, James M Howe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 21, 2003
Use of plasmon spectroscopy to evaluate the mechanical properties of materials at the nanoscaleVladimir P Oleshko, Mitsuhiro Murayama, James M Howe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 20, 2007
A shield for reducing the thermal signal from heating holders during in situ energy-dispersive X-ray spectroscopy analysisSanthana K Eswaramoorthy, James M Howe, Fritz Phillipp
Science (New York, N.Y.)|December 1, 2007
In situ determination of the nanoscale chemistry and behavior of solid-liquid systemsSanthana K Eswaramoorthy, James M Howe, Govindarajan Muralidharan
Journal of Electron Microscopy|June 8, 2004
Effects of heat and electron irradiation on the melting behavior of Al-Si alloy particles and motion of the Al nanosphere withinJames M Howe, Takeshi Yokota, Mitsuhiro Murayama, et al.
Micron (Oxford, England : 1993)|May 30, 2015
Examination of the electronic structure of crystalline and liquid Al versus temperature by in situ electron energy-loss spectroscopy (EELS)Prakash Palanisamy, Maarten de Jong, Mark Asta, et al.
Journal of Nanoscience and Nanotechnology|December 2, 2004
High-resolution and analytical TEM investigation of metastable-tetragonal phase stabilization in undoped nanocrystalline zirconiaVladimir P Oleshko, James M Howe, Satyajit Shukla, et al.
Pageof 2

Showing results (1-10 of 18) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 14, 2019
Determining the Volume Expansion at Grain Boundaries Using Extended Energy-Loss Fine Structure AnalysisProloy Nandi, James M Howe
Ultramicroscopy|September 28, 2011
Are electron tweezers possible?Vladimir P Oleshko, James M Howe
Journal of Electron Microscopy|December 8, 2004
Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscaleJames M Howe, Vladimir P Oleshko
Ultramicroscopy|February 14, 2022
Observation of grain boundary plasmon and associated deconvolution techniques for low-loss electron energy-loss (EEL) spectra acquired from grain boundariesProloy Nandi, Eric R Hoglund, James M Howe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 21, 2003
Use of plasmon spectroscopy to evaluate the mechanical properties of materials at the nanoscaleVladimir P Oleshko, Mitsuhiro Murayama, James M Howe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 20, 2007
A shield for reducing the thermal signal from heating holders during in situ energy-dispersive X-ray spectroscopy analysisSanthana K Eswaramoorthy, James M Howe, Fritz Phillipp
Science (New York, N.Y.)|December 1, 2007
In situ determination of the nanoscale chemistry and behavior of solid-liquid systemsSanthana K Eswaramoorthy, James M Howe, Govindarajan Muralidharan
Journal of Electron Microscopy|June 8, 2004
Effects of heat and electron irradiation on the melting behavior of Al-Si alloy particles and motion of the Al nanosphere withinJames M Howe, Takeshi Yokota, Mitsuhiro Murayama, et al.
Micron (Oxford, England : 1993)|May 30, 2015
Examination of the electronic structure of crystalline and liquid Al versus temperature by in situ electron energy-loss spectroscopy (EELS)Prakash Palanisamy, Maarten de Jong, Mark Asta, et al.
Journal of Nanoscience and Nanotechnology|December 2, 2004
High-resolution and analytical TEM investigation of metastable-tetragonal phase stabilization in undoped nanocrystalline zirconiaVladimir P Oleshko, James M Howe, Satyajit Shukla, et al.
Pageof 2